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The Mathematical Model of Contact Resistance and Injected Current in DRM Tests of SF₆ Circuit Breaker
Liu, Yakui, Zhang, Guogang, Yang, Jinggang, Zhao, Ke, Gao, ShanYear:
2017
Language:
english
Journal:
IEEE Transactions on Components, Packaging and Manufacturing Technology
DOI:
10.1109/tcpmt.2017.2768400
File:
PDF, 1.86 MB
english, 2017