Temperature, Current, and Voltage Dependences of Junction Failure in PIN Photodiodes
Park, Sahnggi, Sim, Eundeok, Park, Jeong-Woo, Sim, Jae-Sik, Song, Hyun-Woo, Oh, Su Hwan, Baek, Yong-SoonVolume:
28
Language:
english
Journal:
ETRI Journal
DOI:
10.4218/etrij.06.0105.0250
Date:
October, 2006
File:
PDF, 437 KB
english, 2006