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[IEEE 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP) - Fort Worth, TX, USA (2017.10.22-2017.10.25)] 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP) - An equivalent circuit for corona discharges caused by a point to plane arrangement at ac, dc and combined voltages
Dezenzo, Tobias, Betz, Thomas, Schwarzbacher, AndreasYear:
2017
Language:
english
DOI:
10.1109/CEIDP.2017.8257456
File:
PDF, 330 KB
english, 2017