[IEEE 2017 IEEE Second Ecuador Technical Chapters Meeting (ETCM) - Salinas, Ecuador (2017.10.16-2017.10.20)] 2017 IEEE Second Ecuador Technical Chapters Meeting (ETCM) - Artificial neural networks and digital image processing: An approach for indirect weight measurement
Benalcazar, Daniel, Benalcazar, David, Erazo, AndresYear:
2017
Language:
english
DOI:
10.1109/ETCM.2017.8247457
File:
PDF, 785 KB
english, 2017