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[IEEE 2017 IEEE Second Ecuador Technical Chapters Meeting (ETCM) - Salinas, Ecuador (2017.10.16-2017.10.20)] 2017 IEEE Second Ecuador Technical Chapters Meeting (ETCM) - Artificial neural networks and digital image processing: An approach for indirect weight measurement

Benalcazar, Daniel, Benalcazar, David, Erazo, Andres
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Year:
2017
Language:
english
DOI:
10.1109/ETCM.2017.8247457
File:
PDF, 785 KB
english, 2017
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