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[IEEE 2017 Symposium on VLSI Circuits - Kyoto, Japan (2017.6.5-2017.6.8)] 2017 Symposium on VLSI Circuits - A sequence dependent challenge-response PUF using 28nm SRAM 6T bit cell
Jeloka, Supreet, Yang, Kaiyuan, Orshansky, Michael, Sylvester, Dennis, Blaauw, DavidYear:
2017
Language:
english
DOI:
10.23919/VLSIC.2017.8008504
File:
PDF, 413 KB
english, 2017