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[IEEE 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Strasbourg, France (2016.10.29-2016.11.6)] 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - A new Geant4 modeling solution based on CAD geometries
Qiu, Y., Lu, L., Fischer, U.Year:
2016
Language:
english
DOI:
10.1109/NSSMIC.2016.8069638
File:
PDF, 639 KB
english, 2016