[IEEE 2017 ACM/IEEE 20th International Conference on Model-Driven Engineering Languages and Systems (MODELS) - Austin, TX (2017.9.17-2017.9.22)] 2017 ACM/IEEE 20th International Conference on Model Driven Engineering Languages and Systems (MODELS) - Ontology-Based Pattern for System Engineering
Ernadote, DominiqueYear:
2017
Language:
english
DOI:
10.1109/MODELS.2017.4
File:
PDF, 566 KB
english, 2017