[IEEE 1996 IEEE Nuclear Science Symposium. Conference Record - Anaheim, CA, USA (2-9 Nov. 1996)] 1996 IEEE Nuclear Science Symposium. Conference Record - Neutron induced damage in GaAs MESFETs
Meneghesso, G., Paccagnella, A., Gasparetto, G., Camin, D.V., Fedyakin, N., Pessina, G., Canali, C.Volume:
1
Year:
1996
Language:
english
DOI:
10.1109/nssmic.1996.590953
File:
PDF, 524 KB
english, 1996