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AIP Conference Proceedings [AIP PHYSICS OF SEMICONDUCTORS: 30th International Conference on the Physics of Semiconductors - Seoul, (Korea) (25–30 July 2010)] - Nanometer-scale Mapping of Dielectric Constant of Ge∕Si Quantum Dots by Using Apertureless Near-field Scanning Optical Microscopy
Ogawa, Y., Nakajima, D., Minami, F., Abate, Yohannes, Leone, Stephen R., Ihm, Jisoon, Cheong, HyeonsikYear:
2011
Language:
english
DOI:
10.1063/1.3666501
File:
PDF, 133 KB
english, 2011