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Protection of On-chip Memory Systems against Multiple Cell Upsets Using Double-adjacent Error Correction Codes
JUN, Hoyoon, LEE, YongsurkVolume:
E98.C
Year:
2015
Language:
english
Journal:
IEICE Transactions on Electronics
DOI:
10.1587/transele.e98.c.267
File:
PDF, 760 KB
english, 2015