Lumped magnetic circuit model for faulty machine...

Lumped magnetic circuit model for faulty machine performance prediction

Zhang, Mengqi, Tseng, King-Jet
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Volume:
50
Language:
english
Journal:
International Journal of Applied Electromagnetics and Mechanics
DOI:
10.3233/JAE-150112
Date:
February, 2016
File:
PDF, 4.47 MB
english, 2016
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