Fast optical inspection of operations of large-area...

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Organic Electronics 2018 / 1

Fast optical inspection of operations of large-area active-matrix backplane by gate modulation imaging

Tsutsumi, Jun'ya, Matsuoka, Satoshi, Kamata, Toshihide, Hasegawa, Tatsuo
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Language:
english
Journal:
Organic Electronics
DOI:
10.1016/j.orgel.2017.12.045
Date:
January, 2018
File:
PDF, 1.66 MB
english, 2018
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