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AIP Conference Proceedings [AIP Publishing LLC PROCEEDINGS OF THE XII INTERNATIONAL SYMPOSIUM ON ELECTRON BEAM ION SOURCES AND TRAPS - East Lansing, Michigan (18–21 May 2014)] - Surface and material analytics based on Dresden-EBIS platform technology
Schmidt, M., König, J., Bischoff, L., Pilz, W., Zschornack, G.Volume:
1640
Year:
2015
Language:
english
DOI:
10.1063/1.4905403
File:
PDF, 881 KB
english, 2015