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Defects induced by solid state reactions at the tungsten-silicon carbide interface
Tunhuma, S. M., Diale, M., Legodi, M. J., Nel, J. M., Thabete, T. T., Auret, F. D.Volume:
123
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5011242
Date:
April, 2018
File:
PDF, 1.15 MB
english, 2018