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The investigation of the zero temperature coefficient point of power MOSFET
Bowen, Zhang, Xiaoling, Zhang, Wenwen, Xiong, Shuojie, She, Xuesong, XieVolume:
37
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/37/6/064011
Date:
June, 2016
File:
PDF, 500 KB
english, 2016