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[IEEE 2017 2nd International Conference for Convergence in Technology (I2CT) - Mumbai, India (2017.4.7-2017.4.9)] 2017 2nd International Conference for Convergence in Technology (I2CT) - Forensic sketch based face recognition using geometrical face model

Patil, Shivaleela., Shubhangi, D. C.
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Year:
2017
Language:
english
DOI:
10.1109/I2CT.2017.8226170
File:
PDF, 978 KB
english, 2017
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