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AIP Conference Proceedings [AIP THE 10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY - Chicago, Illinois, (USA) (15–20 August 2010)] - New Nanoscale Imaging with a Simple Hard X-Ray Nanoslit
Takano, H., Hashimoto, T., Tsuji, T., Koyama, T., Tsusaka, Y., Kagoshima, Y., McNulty, Ian, Eyberger, Catherine, Lai, BarryYear:
2011
Language:
english
DOI:
10.1063/1.3625363
File:
PDF, 396 KB
english, 2011