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Study on Contact Failure Mechanisms of Accelerated Life Test for Relay Reliability
WANG, Shujuan, YU, Qiong, REN, Li, REN, WanbinVolume:
E92-C
Year:
2009
Language:
english
Journal:
IEICE Transactions on Electronics
DOI:
10.1587/transele.e92.c.1034
File:
PDF, 1.25 MB
english, 2009