Thermoreflectance imaging of electromigration evolution in...

Journal of Applied Physics 2018 / 01 Vol. 123; Iss. 3

Thermoreflectance imaging of electromigration evolution in asymmetric aluminum constrictions

Tian, Hao, Ahn, Woojin, Maize, Kerry, Si, Mengwei, Ye, Peide, Alam, Muhammad Ashraful, Shakouri, Ali, Bermel, Peter
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Volume:
123
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5005938
Date:
January, 2018
File:
PDF, 3.85 MB
english, 2018
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