Defect localization and characterization in Eddy current...

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COMPEL Int J for Computation and Maths in Electrical and Electronic Eng 2018 / 01

Defect localization and characterization in Eddy current nondestructive testing by change detection and global optimization

Kermadi, Majda, Moussaoui, Saïd, Taieb Brahimi, Abdelhalim, Feliachi, Mouloud, Sykulski, Jan
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Language:
english
Journal:
COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
DOI:
10.1108/COMPEL-05-2017-0201
Date:
January, 2018
File:
PDF, 1.16 MB
english, 2018
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