[IEEE 2017 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) - Abu Dhabi, United Arab Emirates (2017.10.23-2017.10.25)] 2017 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) - Analyzing the behavior of FinFET SRAMs with resistive defects
Copetti, Thiago S., Balen, Tiago R., Medeiros, Guilherme C., Poehls, Leticia M. B.Year:
2017
Language:
english
DOI:
10.1109/vlsi-soc.2017.8203483
File:
PDF, 499 KB
english, 2017