[IEEE 2017 Silicon Nanoelectronics Workshop (SNW) - Kyoto, Japan (2017.6.4-2017.6.5)] 2017 Silicon Nanoelectronics Workshop (SNW) - Improved electrical characteristics and reliability of multi-stacking PNPN junctionless transistors using channel depletion effect
Lin, Ming-Huei, Shih, Yi-Jia, Liu, Chien, Chiu, Yu-Chien, Fan, Chia-Chi, Liou, Guan-Lin, Cheng, Chun-Hu, Chang, Chun-YenYear:
2017
Language:
english
DOI:
10.23919/SNW.2017.8242290
File:
PDF, 1.05 MB
english, 2017