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Constructing Tolerance Intervals for the Number of Defectives Using Both High- and Low-Resolution Data
Wang, Hsiuying, Tsung, FugeeVolume:
49
Language:
english
Journal:
Journal of Quality Technology
DOI:
10.1080/00224065.2017.11918002
Date:
October, 2017
File:
PDF, 451 KB
english, 2017