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[IEEE 2017 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol (Altai Republic), Russia (2017.6.29-2017.7.3)] 2017 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Experimental confirmation of the modal filtration in four- and five-conductor microstrip lines
Belousov, Anton O., Zabolotsky, Alexander M., Gazizov, Timur T.Year:
2017
Language:
english
DOI:
10.1109/EDM.2017.7981705
File:
PDF, 479 KB
english, 2017