![](/img/cover-not-exists.png)
[IEEE 2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation - Limassol, Cyprus (2017.9.12-2017.9.15)] 2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - Information models in OPC UA and their advantages and disadvantages
Graube, Markus, Hensel, Stephan, Iatrou, Chris, Urbas, LeonYear:
2017
Language:
english
DOI:
10.1109/ETFA.2017.8247691
File:
PDF, 428 KB
english, 2017