Tunneling interferometry and measurement of the thickness of ultrathin metallic Pb(111) films
Ustavshchikov, S. S., Putilov, A. V., Aladyshkin, A. Yu.Volume:
106
Language:
english
Journal:
JETP Letters
DOI:
10.1134/S0021364017200127
Date:
October, 2017
File:
PDF, 2.29 MB
english, 2017