[IEEE 2017 IEEE 12th International Conference on ASIC (ASICON) - Guiyang, China (2017.10.25-2017.10.28)] 2017 IEEE 12th International Conference on ASIC (ASICON) - A new short-channel-effect-degraded subthreshold behavior model for elliptical gate-all-around MOSFET
Chiang, Te-Kuang, Ko, Ying-Wen, Gao, Hong-Wun, Wang, Yeong-HerYear:
2017
Language:
english
DOI:
10.1109/ASICON.2017.8252527
File:
PDF, 377 KB
english, 2017