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[IEEE 2017 IEEE International Symposium on Circuits and Systems (ISCAS) - Baltimore, MD, USA (2017.5.28-2017.5.31)] 2017 IEEE International Symposium on Circuits and Systems (ISCAS) - Investigation of DRAM PUFs reliability under device accelerated aging effects
Tehranipoor, Fatemeh, Karimian, Nima, Yan, Wei, Chandy, John A.Year:
2017
Language:
english
DOI:
10.1109/ISCAS.2017.8050629
File:
PDF, 162 KB
english, 2017