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NAND Flash Memory Forensic Analysis and the Growing Challenge of Bit Errors
van Zandwijk, Jan Peter, Fukami, AyaVolume:
15
Language:
english
Journal:
IEEE Security & Privacy
DOI:
10.1109/MSP.2017.4251114
Date:
November, 2017
File:
PDF, 1.04 MB
english, 2017