NAND Flash Memory Forensic Analysis and the Growing...

IEEE Security & Privacy Magazine 2017 / 11 Vol. 15; Iss. 6

NAND Flash Memory Forensic Analysis and the Growing Challenge of Bit Errors

van Zandwijk, Jan Peter, Fukami, Aya
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
15
Language:
english
Journal:
IEEE Security & Privacy
DOI:
10.1109/MSP.2017.4251114
Date:
November, 2017
File:
PDF, 1.04 MB
english, 2017
Conversion to is in progress
Conversion to is failed