A Circuit Modeling Technique for the ISO 7637-3 Capacitive...

IEEE Transactions on Electromagnetic Compatibility 2018 / 8 Vol. 60; Iss. 4

A Circuit Modeling Technique for the ISO 7637-3 Capacitive Coupling Clamp Test

Lambrecht, Niels, Pues, H., De Zutter, Daniel, Ginste, Dries Vande
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/TEMC.2017.2765690
Date:
August, 2018
File:
PDF, 1.11 MB
english, 2018
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