Graphene on C-terminated face of 4H-SiC observed by noncontact scanning nonlinear dielectric potentiometry
Yamasue, Kohei, Fukidome, Hirokazu, Tashima, Keiichiro, Suemitsu, Maki, Cho, YasuoVolume:
55
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.55.08NB02
Date:
August, 2016
File:
PDF, 1.54 MB
english, 2016