(Invited) Probing the Intrinsic Limitations of the Contact...

ECS Transactions 2017 / 08 Vol. 80; Iss. 1

(Invited) Probing the Intrinsic Limitations of the Contact Resistance of Metal/Semiconductor Interfaces through Atomistic Simulations

Pourtois, Geoffrey, Dabral, Ashish, Sankaran, Kiroubanand, Magnus, Wim, Yu, Hao, de Jamblinne de Meux, Albert, Lu, Anh Khoa Augustin, Clima, Sergiu, Stokbro, Kurt, Schaekers, Marc, Houssa, Michel, Col
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Volume:
80
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/08001.0303ecst
Date:
August, 2017
File:
PDF, 769 KB
english, 2017
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