Susceptibility of flash ADCs to electromagnetic interference
Kennedy, Simon, Yuce, Mehmet Rasit, Redouté, Jean-MichelVolume:
81
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.12.040
Date:
February, 2018
File:
PDF, 2.30 MB
english, 2018