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[IEEE 2017 IEEE International Joint Conference on Biometrics (IJCB) - Denver, CO, USA (2017.10.1-2017.10.4)] 2017 IEEE International Joint Conference on Biometrics (IJCB) - Deep features-based expression-invariant tied factor analysis for emotion recognition

Munasinghe, Sarasi, Fookes, Clinton, Sridharan, Sridha
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Year:
2017
Language:
english
DOI:
10.1109/BTAS.2017.8272741
File:
PDF, 822 KB
english, 2017
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