[IEEE 2017 IEEE International Joint Conference on Biometrics (IJCB) - Denver, CO, USA (2017.10.1-2017.10.4)] 2017 IEEE International Joint Conference on Biometrics (IJCB) - Deep features-based expression-invariant tied factor analysis for emotion recognition
Munasinghe, Sarasi, Fookes, Clinton, Sridharan, SridhaYear:
2017
Language:
english
DOI:
10.1109/BTAS.2017.8272741
File:
PDF, 822 KB
english, 2017