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[IEEE 2017 75th Device Research Conference (DRC) - South Bend, IN, USA (2017.6.25-2017.6.28)] 2017 75th Annual Device Research Conference (DRC) - MoS2 negative capacitance FETs with CMOS-compatible hafnium zirconium oxide
McGuire, Felicia A., Lin, Yuh-Chen, Rayner, Bruce, Franklin, Aaron D.Year:
2017
Language:
english
DOI:
10.1109/DRC.2017.7999478
File:
PDF, 1.17 MB
english, 2017