[IEEE 2017 75th Device Research Conference (DRC) - South...

  • Main
  • [IEEE 2017 75th Device Research...

[IEEE 2017 75th Device Research Conference (DRC) - South Bend, IN, USA (2017.6.25-2017.6.28)] 2017 75th Annual Device Research Conference (DRC) - MoS2 negative capacitance FETs with CMOS-compatible hafnium zirconium oxide

McGuire, Felicia A., Lin, Yuh-Chen, Rayner, Bruce, Franklin, Aaron D.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
Language:
english
DOI:
10.1109/DRC.2017.7999478
File:
PDF, 1.17 MB
english, 2017
Conversion to is in progress
Conversion to is failed