[IEEE 2017 IEEE Workshop on Information Forensics and...

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[IEEE 2017 IEEE Workshop on Information Forensics and Security (WIFS) - Rennes, France (2017.12.4-2017.12.7)] 2017 IEEE Workshop on Information Forensics and Security (WIFS) - Retrieving dates in smart card dumps is as hard as finding a needle in a haystack

Gougeon, Thomas, Barbier, Morgan, Lacharme, Patrick, Avoine, Gildas, Rosenberger, Christophe
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Year:
2017
Language:
english
DOI:
10.1109/WIFS.2017.8267663
File:
PDF, 137 KB
english, 2017
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