Nanospectroscopy Imaging Techniques: Using NSOM and TERS...

IEEE Nanotechnology Magazine 2017 / 12 Vol. 11; Iss. 4

Nanospectroscopy Imaging Techniques: Using NSOM and TERS for Semiconductor Materials Imaging

Yin, Yu-Tung, Lin, Hung-Ming, Wang, Chia-Ching, Chou, Mei-Hua, Chou, Shih-Jie, Kuo, Yu-Shuan, Kim, DongHyun, Chen, Liang-Yih, Chen, Ching-Hsiang
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Volume:
11
Language:
english
Journal:
IEEE Nanotechnology Magazine
DOI:
10.1109/MNANO.2017.2746992
Date:
December, 2017
File:
PDF, 2.21 MB
english, 2017
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