[IEEE 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017 - Honololu, HI, USA (2017.6.4-2017.6.9)] 2017 IEEE MTT-S International Microwave Symposium (IMS) - Lumped element balun with inherent complex impedance transformation
Frank, Markus, Thorsell, Mattias, Enoksson, PeterYear:
2017
Language:
english
DOI:
10.1109/MWSYM.2017.8058843
File:
PDF, 262 KB
english, 2017