Robust Light Field Depth Estimation using Occlusion-Noise...

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IEEE Transactions on Pattern Analysis and Machine Intelligence 2017

Robust Light Field Depth Estimation using Occlusion-Noise Aware Data Costs

Williem,, Park, In Kyu, Lee, Kyoung Mu
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Pattern Analysis and Machine Intelligence
DOI:
10.1109/TPAMI.2017.2746858
File:
PDF, 25.91 MB
english, 2017
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