Upper and Lower Tight Error Bounds for Feature Omission with an Extension to Context Reduction
Schlueter, Ralf, Beck, Eugen, Ney, HermannYear:
2018
Language:
english
Journal:
IEEE Transactions on Pattern Analysis and Machine Intelligence
DOI:
10.1109/tpami.2017.2788434
File:
PDF, 27.41 MB
english, 2018