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[IEEE 2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE) - Kanazawa (2017.9.19-2017.9.22)] 2017 56th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE) - Simulation based prior evaluation of 3-D EIT system with a small number of electrodes
Ito, Tadashi, Kaneda, Naosumi, Higuchi, YuuichiYear:
2017
Language:
english
DOI:
10.23919/SICE.2017.8105663
File:
PDF, 631 KB
english, 2017