[IEEE 2017 IEEE International Electron Devices Meeting...

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[IEEE 2017 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2017.12.2-2017.12.6)] 2017 IEEE International Electron Devices Meeting (IEDM) - A FeFET based super-low-power ultra-fast embedded NVM technology for 22nm FDSOI and beyond

Dunkel, S., Trentzsch, M., Richter, R., Moll, P., Fuchs, C., Gehring, O., Majer, M., Wittek, S., Muller, B., Melde, T., Mulaosmanovic, H., Slesazeck, S., Muller, S., Ocker, J., Noack, M., Lohr, D.-A.,
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Year:
2017
Language:
english
DOI:
10.1109/IEDM.2017.8268425
File:
PDF, 1.37 MB
english, 2017
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