[IEEE 2017 IEEE International Symposium on Circuits and Systems (ISCAS) - Baltimore, MD, USA (2017.5.28-2017.5.31)] 2017 IEEE International Symposium on Circuits and Systems (ISCAS) - Enhancing PUF reliability by machine learning
Wen, Yuejiang, Lao, YingjieYear:
2017
Language:
english
DOI:
10.1109/ISCAS.2017.8050672
File:
PDF, 895 KB
english, 2017