[IEEE 2017 IEEE International Symposium on Circuits and...

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[IEEE 2017 IEEE International Symposium on Circuits and Systems (ISCAS) - Baltimore, MD, USA (2017.5.28-2017.5.31)] 2017 IEEE International Symposium on Circuits and Systems (ISCAS) - Enhancing PUF reliability by machine learning

Wen, Yuejiang, Lao, Yingjie
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Year:
2017
Language:
english
DOI:
10.1109/ISCAS.2017.8050672
File:
PDF, 895 KB
english, 2017
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