Modeling and Analysis of Large-Signal RFI Effects in MOS...

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IEEE Transactions on Electromagnetic Compatibility 2018

Modeling and Analysis of Large-Signal RFI Effects in MOS Transistors

Pouant, Clovis, Torres, Francois, Reineix, Alain, Hoffmann, Patrick, Raoult, Jeremy, Chusseau, Laurent
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/TEMC.2017.2785960
File:
PDF, 3.49 MB
english, 2018
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