[IEEE 2017 IEEE International Conference on Electro Information Technology (EIT) - Lincoln, NE, USA (2017.5.14-2017.5.17)] 2017 IEEE International Conference on Electro Information Technology (EIT) - Sparse representation classification based linear integration of ℓ 1 -norm and ℓ 2 -norm for robust face recognition
Awedat, Khalfalla, Essa, Almabrok, Asari, VijayanYear:
2017
Language:
english
DOI:
10.1109/eit.2017.8053403
File:
PDF, 708 KB
english, 2017