[IEEE 2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Irvine, CA (2017.11.13-2017.11.16)] 2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Speeding up crossbar resistive memory by exploiting in-memory data patterns
Wen, Wen, Zhao, Lei, Zhang, Youtao, Yang, JunYear:
2017
Language:
english
DOI:
10.1109/iccad.2017.8203787
File:
PDF, 871 KB
english, 2017