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[IEEE 2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Irvine, CA (2017.11.13-2017.11.16)] 2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Speeding up crossbar resistive memory by exploiting in-memory data patterns

Wen, Wen, Zhao, Lei, Zhang, Youtao, Yang, Jun
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Year:
2017
Language:
english
DOI:
10.1109/iccad.2017.8203787
File:
PDF, 871 KB
english, 2017
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