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[IEEE 2017 IEEE International Test Conference (ITC) - Fort Worth, TX (2017.10.31-2017.11.2)] 2017 IEEE International Test Conference (ITC) - A run-pause-resume silicon debug technique with cycle granularity for multiple clock domain systems
Hong, Shuo-Lian, Lee, Kuen-JongYear:
2017
Language:
english
DOI:
10.1109/test.2017.8242077
File:
PDF, 472 KB
english, 2017