Synchrotron analysis of structure transformations in V and...

Vacuum 2018 / 04 Vol. 150

Synchrotron analysis of structure transformations in V and V/Ag thin films

Orlov, A.K., Kruhlov, I.O., Shamis, O.V., Vladymyrskyi, I.A., Kotenko, I.E., Voloshko, S.M., Sidorenko, S.I., Ebisu, T., Kato, K., Tajiri, H., Sakata, O., Ishikawa, T.
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Volume:
150
Language:
english
Journal:
Vacuum
DOI:
10.1016/j.vacuum.2018.01.044
Date:
April, 2018
File:
PDF, 2.96 MB
english, 2018
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