[IEEE 2017 IEEE 5th International Symposium on Electromagnetic Compatibility (EMC-Beijing) - Beijing, China (2017.10.28-2017.10.31)] 2017 IEEE 5th International Symposium on Electromagnetic Compatibility (EMC-Beijing) - A study on ESD protection characteristic difference measurement of TVS diodes by VNA
Yoshida, Takahiro, Endo, ManabuYear:
2017
DOI:
10.1109/EMC-B.2017.8260474
File:
PDF, 1.77 MB
2017