Scanning microwave microscopy applied to semiconducting...

Review of Scientific Instruments 2018 / 02 Vol. 89; Iss. 2

Scanning microwave microscopy applied to semiconducting GaAs structures

Buchter, Arne, Hoffmann, Johannes, Delvallée, Alexandra, Brinciotti, Enrico, Hapiuk, Dimitri, Licitra, Christophe, Louarn, Kevin, Arnoult, Alexandre, Almuneau, Guilhem, Piquemal, François, Zeier, Mark
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Volume:
89
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5015966
Date:
February, 2018
File:
PDF, 17.67 MB
english, 2018
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